Mapping and Quantitative Trait Loci Analysis of Verticillium Wilt Resistance Genes in Cotton
Hong-Mei Wang, Zhong-Xu Lin, Xian-Long Zhang, Wei Chen, Xiao-Ping Guo, Yi-Chun Nie and Yun-Hai Li
Mapping and Quantitative Trait Loci Analysis of Verticillium Wilt Resistance Genes in Cotton
Hong-Mei Wang, Zhong-Xu Lin, Xian-Long Zhang, Wei Chen, Xiao-Ping Guo, Yi-Chun Nie and Yun-Hai Li
J Integr Plant Biol
.
2008, (2): 174
-182
.
DOI: 10.1111/j.1744-7909.2007.00612.x
