J Integr Plant Biol. ›› 2004, Vol. 46 ›› Issue (10): 1249-1255.

• Research Articles • Previous Articles     Next Articles

Quantitative Roughness Analysis of Post-harvest Agaricus bisporus by Atomic Force Microscopy

YANG Hong-Shun, FENG Guo-Ping, AN Hong-Jie, LI Yun-Fei   


The moisture loss degree is important in determining the quality of post-harvest mushroom (Agaricus bisporus (Lange) Sing). Quantitative roughness analyzed by atomic force microscopy (AFM) was proposed to denote the degree of shrinkage, with arithmetic average roughness (Ra) and root mean square roughness (Rq) as parameters. The initial value of Ra was (30.035±1.839) nm, while those of 2 ℃, 25 ℃ and dynamic temperature on the 2nd day were (40.139±3.359) nm, (54.393±13.534) nm and (41.197± 6.555) nm, respectively. There is a similar tendency for the results of Ra and Rq. Both values of roughness increased in duration of storage and with increasing temperatures. The three-dimensional profile of the pileus epicutis could signify the process of water evaporation intuitionally. The tendency was in accordance with the roughness results, especially for the earlier stage of the storage (0-2 d). The outcome of roughness analysis could signify the differences of storage conditions. It was shown that the roughness measured by atomic force microscopy effectively reflected the moisture loss degree of the mushroom pileus epicutis during post-harvest storage.

Key words: mushroom, roughness degree, atomic force microscopy (AFM), moisture loss, modified atmosphere

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